Temple University's Nano Instrumentation Center (electron microscopy facility) is a core analytical characterization and nano-fabrication facility accessible to all research and educational activities at Temple and industry. It provides efficient access to state-of-the-art instrumentation and enhances research, education and outreach related to all aspects of electron microscopy techniques and applications.

Scanning electron microscope (FEI Quanta 450FEG)

Equipped with the energy dispersive X-ray spectrometer (Oxford Aztec Energy Advanced EDS) and an E-beam lithography package, these nanotechnology tools address the need to characterize structures and composition of a wide variety of materials down to a few nanometers in size.

Key features

• High-resolution field emission gun SEM with environmental imaging technology (ESEM)
• ESEM modes enable imaging and analysis of nonconductive and/or hydrated specimens
• High-resolution bright and dark field imaging by transmission electron detector (STEM)
• Characterize any sample’s atomic composition by energy dispersive X-ray spectrometer (EDS)
• Microtensile stage for in situ mechanical measurements (tension, compression, bending)
• Electron-beam lithography (EBL) patterning
• Easy-to-use, intuitive software makes highly effective operation possible for novice users

Requesting a service or becoming a user

To use the Nano Instrumentation Center, follow these steps:

1. Complete the SEM Request Form 

• Include FOAPAL account information and obtain your PI’s signature
• Submit the form to the facility manager either as a paper copy or electronically

2. Create your account

• Go to the Temple Facility Online Manager 
• Select “I am a new user” and choose one of the following options:
  • For SEM training: Select "To be trained" under FEI Quanta 450 FEG.
  • For TEM training: Select "To be trained" under TEM JEOL JEM-1400.
  • For gold deposition*: Select "To be trained" under Gold Sputter Coater.

*If your sample is not electrically conductive or is very sensitive to electron beam damage, we recommend covering it with a nanometer-thick gold film.

3. User fees structure

• SEM user fees

4. Manuals and useful information

1. SEM FEI Quanta x50 Initial Suggested Conditions PDF 
2. EDS Oxford-Quantitative-Guide PDF 
3. SEM Stage FEI Quanta 450FEG SEM PDF
4. Basic Photoshop for Electron Microscopy PDF
5. Conventional SEM of Bacteria PDF
6. WetSEM-Imaging Wet Cells QuantronixQX PDF 
7. Electron Beam Lithography Introduction PDF
8. Electron Beam Lithography Converting Image To SDB-Compatible BMP File PDF
9. Links to suppliers of electron microscopy parts: TED PELLA, Inc., SPI Supplies, Electron Microscopy Sciences

Publication guidelines 

Acknowledging the contributions of core facility scientists in research publications is essential for maintaining the integrity of the scientific record and recognizing the valuable support these professionals provide.

Criteria for acknowledgment

A core facility scientist should be acknowledged if their involvement supports the research but does not meet the thresholds for co-authorship. This includes:

• Technical assistance: Providing routine training, technical help or operational equipment expertise
• Data collection: Collecting data without being involved in its interpretation
• General support: Offering general support that facilitated the research process

Criteria for co-authorship

A core facility scientist should be considered for co-authorship if they have made substantial contributions in one or more of the following areas:

• Conception or design: Significantly contributing to the conception or design of the research project, including providing “nonroutine” training
• Data acquisition, analysis or interpretation: Engaging in data acquisition, analysis, or interpretation beyond routine practices, and providing insights that enhance the study’s value
• Manuscript drafting or revision: Participating in drafting the manuscript or critically revising it for important intellectual content

A core scientist has the discretion to decline an invitation for authorship if they believe that the data and interpretation are not consistent with professional standards. This may include requesting the withdrawal of data or figures generated by the core scientist from the manuscript.