Temple University’s Nano Instrumentation Center – Electron Microscopy Facility is a multidisciplinary shared research facility providing advanced electron microscopy, micro- and nanofabrication, multimodal characterization, and three-dimensional imaging services for researchers from academia, government laboratories, and industry. The facility supports collaborative research, user training, education, and industrial partnerships across a broad range of disciplines. By integrating complementary imaging, analytical, and sample preparation techniques, NIC-EM enables researchers to investigate materials and biological specimens across length scales ranging from millimeters to nanometers. 

Research Capabilities 

• High-resolution scanning and transmission electron microscopy  

• Multiscale structural, crystallographic, and chemical characterization  

• Automated three-dimensional serial sectioning and volumetric reconstruction  

• Cryogenic imaging of hydrated and air-sensitive materials  

• Focused ion beam (FIB) and plasma FIB (PFIB) sample preparation  

• TEM lamella preparation and lift-out  

• Nanofabrication and electron-beam/ion-beam machining  

• Failure analysis and reverse engineering  

Major Instrumentation 

Thermo Fisher Helios 5 Hydra Laser TriBeam is an advanced multiscale characterization platform integrating a high-resolution field-emission SEM, plasma focused ion beam (PFIB), and femtosecond laser machining in a single instrument. The system enables rapid excavation of large volumes, high-resolution imaging, automated three-dimensional reconstruction, and site-specific specimen preparation over length scales ranging from millimeters to nanometers. Integrated analytical capabilities include: 

• Plasma FIB (Xe) and femtosecond laser milling for rapid large-volume material removal  

• Ultra-high-resolution field emission SEM imaging including STEM transmission imaging with BF/DF/HAADF detection 

• Automated TEM lamella preparation (AutoTEM™)  

• Automated serial sectioning and 3D tomography  

• Energy dispersive X-ray spectroscopy (EDS)  

• Electron backscatter diffraction (EBSD)  

• Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)  

• Cryogenic stage for sensitive, hydrated or volatile materials  

• Gas Injection System (GIS) and advanced automation for multimodal characterization  

Typical applications include semiconductor devices, batteries, quantum materials, biomaterials, geological specimens, additive manufacturing, advanced composites, and failure analysis. 

More information, application examples, and technical specifications are available at sites.temple.edu/NIC. 

Thermo Fisher Scios 2 DualBeam combines a high-resolution field-emission scanning electron microscope with a precision gallium focused ion beam (Ga-FIB). Key capabilities include: 

• Sub-nanometer SEM imaging from 1–30 kV  

• High-precision Ga-FIB milling and cross-sectioning  

• STEM transmission imaging with BF/DF/HAADF detection 

• Automated TEM lamella preparation (AutoTEM™)  

• Automated Slice & View™ serial sectioning  

• MAPS™ large-area and correlative imaging  

• Oxford Instruments EDS elemental analysis  

• CleanConnect™ vacuum and inert-gas transfer including cryogenic transfer for hydrated and air-sensitive materials  

• Nanomanipulator and Gas Injection System (GIS) for advanced FIB workflows  

The Scios 2 is well suited for routine and advanced characterization of polymeric, biological, electronic, and structural materials, as well as interface analysis, site-specific characterization, failure analysis, semiconductor research, cryogenic microscopy, and nanoscale fabrication. Additional application notes, user documentation, and operating procedures are available at sites.temple.edu/NIC. 

JEOL JEM-1400 TEM/STEM is a 120 kV transmission electron microscope designed for high-contrast imaging of biological specimens, polymers, and advanced materials. The instrument supports conventional TEM and STEM imaging, elemental analysis by EDS, cryogenic transfer, and in situ heating experiments for studying structural evolution under controlled conditions. 

The TEM complements the DualBeam and TriBeam platforms by providing high-resolution transmission imaging and analytical characterization of site-specific specimens prepared by focused ion beam techniques. 

User Access and Services 

NIC-EM supports both independent users and collaborative research projects. Services include: 

• Instrument training and certification  

• Experimental planning and consultation  

• Electron microscopy and microanalysis  

• FIB/PFIB sample preparation  

• 3D reconstruction, AI-assisted segmentation, and multimodal imaging and compositional data analysis using Avizo  

• Collaborative research support  

• Industrial characterization and failure analysis  

Detailed information about user access, training, SOPs, rates, scheduling, services, documentation, and workshops is available at sites.temple.edu/NIC.