Temple University’s College of Science and Technology will host a free two-day workshop exploring advanced microscopy technologies and their applications in materials science and life sciences.

The Temple NIC-EM Workshop on SEM-FIB Microscopy, titled Discovering the Technology: From Samples to Scientific Results, will take place September 2–3 at the Science Education and Research Center. The workshop is co-hosted by Temple University and Thermo Fisher Scientific.

Participants will explore DualBeam microscopy and scanning electron microscopy/focused ion beam (SEM-FIB) technologies, including 3D characterization, large-area imaging, FIB cross-sectioning and transmission electron microscopy sample preparation. Thermo Fisher application scientists will lead expert presentations, live demonstrations and selected hands-on training opportunities.

The program will also introduce participants to Avizo software for visualization, segmentation, registration and quantitative analysis, connecting microscopy data with multimodal and correlative research workflows.

The two-day agenda includes practical sessions ranging from SEM-FIB fundamentals and AutoTEM workflows to artificial intelligence-assisted microscopy and advanced data visualization. Participants will also have opportunities to discuss their research challenges and future projects with microscopy and image-analysis specialists.

The workshop is organized by Dmitriy Dikin, director of Temple’s NIC-EM facility, and Brody Mistrot, NIC facility manager, in collaboration with experts from Thermo Fisher Scientific.

Learn more about the Temple Nano Instrumentation Center (NIC – EM | Electron Microscopy Facility) here.